X-Ray Image Edge Detection Based on Wavelet Transform and Lipschitz Exponent

  • Authors:

  • Guowei Tang;Xiaoqing Zhong;Fangzhou Zhang;Zhenying Jin

  • Affiliations:

  • -;-;-;-

  • Venue:
  • IITSI '09 Proceedings of the 2009 Second International Symposium on Intelligent Information Technology and Security Informatics
  • Year:
  • 2009

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Abstract

The characteristics of X-ray testing image are analyzed and an edge detection algorithm based on the multi-scale and multi-resolution of wavelet transform is proposed. According to the propagation of modulus maximum under different scales and the relationship between wavelet transform and Lipschitz exponent, the local maxima in vertical, horizontal and diagonal directions are detected by quadratic B-spline and Mallat algorithm was used in wavelet decomposition to determine defect edges. The experiment results prove that the algorithm of edge detection works fine the X-ray images.