Reusability-based selection of parametric finite element analysis models

  • Authors:
  • Nsikan Udoyen;David w. Rosen

  • Affiliations:
  • Systems realization laboratory, george w. woodruff school of mechanical engineering, georgia institute of technology, atlanta, georgia, usa;Systems realization laboratory, george w. woodruff school of mechanical engineering, georgia institute of technology, atlanta, georgia, usa

  • Venue:
  • Artificial Intelligence for Engineering Design, Analysis and Manufacturing
  • Year:
  • 2009

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Abstract

A selection method to support adaptive reuse of parametric finite element analysis (FEA) models is introduced in this paper. Adaptive reuse of engineering artifacts such as FEA models is common in product design, but difficult to automate because of the need to integrate new information. The proposed method factors reusability into selection by evaluating models based on comparative estimates of effort involved in adapting them for reuse to model a query problem. The method is developed for FEA models of component-based designs. FEA modeling of electronic chip packages is used to illustrate the method's usefulness. We conclude with a discussion on the method's advantages and limitations and highlight important issues for further research.