Image Restoration for Quantifying TFT-LCD Defect Levels

  • Authors:
  • Kyu Nam Choi;No Kap Park;Suk In Yoo

  • Affiliations:
  • -;-;-

  • Venue:
  • IEICE - Transactions on Information and Systems
  • Year:
  • 2008

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Abstract

Though machine vision systems for automatically detecting visual defects, called mura, have been developed for thin flat transistor liquid crystal display (TFT-LCD) panels, they have not yet reached a level of reliability which can replace human inspectors. To establish an objective criterion for identifying real defects, some index functions for quantifying defect levels based on human perception have been recently researched. However, while these functions have been verified in the laboratory, further consideration is needed in order to apply them to real systems in the field. To begin with, we should correct the distortion occurring through the capturing of panels. Distortion can cause the defect level in the observed image to differ from that in the panel. There are several known methods to restore the observed image in general vision systems. However, TFT-LCD panel images have a unique background degradation composed of background non-uniformity and vignetting effect which cannot easily be restored through traditional methods. Therefore, in this paper we present a new method to correct background degradation of TFT-LCD panel images using principal component analysis (PCA). Experimental results show that our method properly restores the given observed images and the transformed shape of muras closely approaches the original undistorted shape.