A Case-Based Reasoning Approach To The Identification Of Materials From Diffraction Patterns

  • Authors:

  • Giora Kimmel;Yaakov HaCohen-Kerner;Ephraim Nissan;Eugen Berman

  • Affiliations:

  • Institutes for Applied Research, Ben-Gurion University of the Negev, Beer-Sheva, Israel;Department of Computer Science, Jerusalem College of Technology (Machon Lev), Jerusalem, Israel;Department of Computing, Goldsmiths' College, University of London, London, UK;Institutes for Applied Research, Ben-Gurion University of the Negev, Beer-Sheva, Israel

  • Venue:
  • Applied Artificial Intelligence
  • Year:
  • 2009

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Abstract

X-ray diffractometry, within materials engineering, is a promising area of application for case-based reasoning. A large database of spectral diffraction patterns includes entries with different quality marks; moreover, several diffraction patterns happen to be equivalent, identifying the same material (crystalline phase), even though it also happens, that a spectral diffraction pattern alone would not identify a crystalline phase, and parameters such as density also have to be involved for identification. Current practice in the scanning and processing of so-called powder diffraction files, out of a database of files (formerly cards), calls for improvements of various kinds. Arguably, case-based reasoning is a technique from within AI that appears to exhibit a very interesting potential to make the process of identification less cumbersome.