A systematic method for generating quality requirements spectrum

Authors:
Shunichi Suzuki;Akira Osada;Tomonori Sato;Haruhiko Kaiya;Masaaki Tanigawa;Kenji Kaijiri
Affiliations:
Shinshu University, Japan;Shinshu University, Japan;Shinshu University, Japan;Shinshu University and GRACE Center NII, Japan;Shinshu University, Japan;Shinshu University, Japan
Venue:
Proceedings of the 2009 ACM symposium on Applied Computing
Year:
2009

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Abstract

Spectrum analysis for quality requirements is useful for measuring and tracking them, but current spectrum analysis largely depends on expertise of each analyst. Therefore, it takes a lot of efforts to perform the analysis and is hard to reuse experiences for such analysis. We introduce domain knowledge called term-characteristic map to improve current spectrum analysis for quality requirements. Through several experiments, we evaluated the improved method for spectrum analysis.