Dedicated image analysis techniques for three-dimensional reconstruction from serial sections in electron microscopy

• Authors:

• Ph. Gremillet;M. Jourlin;Cph. Bron;J. Schüpbach;H. P. Gautschi;Th. Bächi

• Affiliations:

• -;-;-;-;-;-

• Venue:
• Machine Vision and Applications - Special issue: Three-dimensional microscopy
• Year:
• 1991