Invariant pattern recognition using radon, dual-tree complex wavelet and Fourier transforms

Authors:
G. Y. Chen;T. D. Bui;A. Krzyak
Affiliations:
Department of Computer Science and Software Engineering, Concordia University, Montreal, Quebec, Canada H3G 1M8;Department of Computer Science and Software Engineering, Concordia University, Montreal, Quebec, Canada H3G 1M8;Department of Computer Science and Software Engineering, Concordia University, Montreal, Quebec, Canada H3G 1M8
Venue:
Pattern Recognition
Year:
2009

Citing 12
Cited 4

An application of wavelet-based affine-invariant representation

Pattern Recognition Letters
Wavelet-Based Affine Invariant Representation: A Tool for Recognizing Planar Objects in 3D Space

IEEE Transactions on Pattern Analysis and Machine Intelligence
Recognition of 2D Object Contours Using the Wavelet Transform Zero-Crossing Representation

IEEE Transactions on Pattern Analysis and Machine Intelligence
A Fast Discrete Approximation Algorithm for the Radon Transform

SIAM Journal on Computing
Invariant 2D object recognition using the wavelet modulus maxima

Pattern Recognition Letters
Feature extraction using wavelet and fractal

Pattern Recognition Letters
Image Representation Via a Finite Radon Transform

IEEE Transactions on Pattern Analysis and Machine Intelligence
Shift invariant properties of the dual-tree complex wavelet transform

ICASSP '99 Proceedings of the Acoustics, Speech, and Signal Processing, 1999. on 1999 IEEE International Conference - Volume 03
Feature Extraction and Dimensionality Reduction Using Radon and Fourier Transforms with Application to Face Recognition

ICCIMA '07 Proceedings of the International Conference on Computational Intelligence and Multimedia Applications (ICCIMA 2007) - Volume 02
Rotation invariant pattern recognition using ridgelets, wavelet cycle-spinning and Fourier features

Pattern Recognition
The discrete periodic Radon transform

IEEE Transactions on Signal Processing
The fast discrete Radon transform. I. Theory

IEEE Transactions on Image Processing

Face recognition using dual-tree complex wavelet features

IEEE Transactions on Image Processing
Invariant pattern recognition using the RFM descriptor

Pattern Recognition
Circular projection for pattern recognition

ISNN'13 Proceedings of the 10th international conference on Advances in Neural Networks - Volume Part I
Illumination invariant face recognition

ICIC'13 Proceedings of the 9th international conference on Intelligent Computing Theories

Quantified Score

Hi-index	0.01

Visualization

Abstract

An invariant pattern recognition descriptor is proposed in this paper by using the radon transform, the dual-tree complex wavelet transform and the Fourier transform. The radon transform can capture the directional features of the pattern image by projecting the pattern onto different orientation slices. The dual-tree complex wavelet transform can select shift-invariant features in a multiresolution way. The Fourier transform can extract features that are invariant to rotation of the patterns. Standard normalization techniques are used to normalize the input pattern image so that it is translation and scale invariant. Experiments conducted in this paper show that the proposed descriptor achieves high recognition rates for different combinations of rotation angles and noise levels. The descriptor is very robust to Gaussian white noise even when the noise level is very high.