Fine-Grain Leakage Power Reduction Method for m-out-of-n Encoded Circuits Using Multi-threshold-Voltage Transistors

  • Authors:
  • Masashi Imai;Kouei Takada;Takashi Nanya

  • Affiliations:
  • -;-;-

  • Venue:
  • ASYNC '09 Proceedings of the 2009 15th IEEE Symposium on Asynchronous Circuits and Systems (async 2009)
  • Year:
  • 2009

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Abstract

To the casual observer, glitches occurring in quasi delay-insensitive logic would appear to cause incorrect operation and render the circuits unusable. This paper presents an informal analysis of the effects of glitches occurring on the long interconnect ...