Probabilistic Event Extraction from RFID Data

Authors:
Nodira Khoussainova;Magdalena Balazinska;Dan Suciu
Affiliations:
Computer Science&Engineering Department, University of Washington, Seattle, Washington, USA. nodira@cs.washington.edu;Computer Science&Engineering Department, University of Washington, Seattle, Washington, USA. magda@cs.washington.edu;Computer Science&Engineering Department, University of Washington, Seattle, Washington, USA. suciu@cs.washington.edu
Venue:
ICDE '08 Proceedings of the 2008 IEEE 24th International Conference on Data Engineering
Year:
2008

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Abstract

We present PEEX, a system that enables applications to define and extract meaningful probabilistic high-level events from RFID data. PEEX effectively copes with errors in the data and the inherent ambiguity of event extraction.