Learning from measurements in exponential families

  • Authors:
  • Percy Liang;Michael I. Jordan;Dan Klein

  • Affiliations:
  • University of California, Berkeley, CA;University of California, Berkeley, CA;University of California, Berkeley, CA

  • Venue:
  • ICML '09 Proceedings of the 26th Annual International Conference on Machine Learning
  • Year:
  • 2009

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Abstract

Given a model family and a set of unlabeled examples, one could either label specific examples or state general constraints---both provide information about the desired model. In general, what is the most cost-effective way to learn? To address this question, we introduce measurements, a general class of mechanisms for providing information about a target model. We present a Bayesian decision-theoretic framework, which allows us to both integrate diverse measurements and choose new measurements to make. We use a variational inference algorithm, which exploits exponential family duality. The merits of our approach are demonstrated on two sequence labeling tasks.