Top-Down Approach to Image Similarity Measures

Authors:
Jacek Piotrowski
Affiliations:
Institute of Computer Science, Computer Graphics Laboratory, Warsaw University of Technology, Warsaw, Poland 00-665
Venue:
ICCVG 2008 Proceedings of the International Conference on Computer Vision and Graphics: Revised Papers
Year:
2008

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Abstract

We propose a method of verification whether it is possible to measure image similarity by constructing a vector of metrics, regardless of what low-level features were extracted from images. We also present an on-line system which will be used to gather a dataset required to conduct the proposed experiment.