Semi-supervised orthogonal discriminant analysis via label propagation

  • Authors:
  • Feiping Nie;Shiming Xiang;Yangqing Jia;Changshui Zhang

  • Affiliations:
  • State Key Laboratory of Intelligent Technology and Systems, Tsinghua National Laboratory for Information Science and Technology, Department of Automation, Tsinghua University, Beijing 100084, Chin ...;National Laboratory of Pattern Recognition, Institute of Automation, Chinese Academy of Sciences, Beijing 100190, China;State Key Laboratory of Intelligent Technology and Systems, Tsinghua National Laboratory for Information Science and Technology, Department of Automation, Tsinghua University, Beijing 100084, Chin ...;State Key Laboratory of Intelligent Technology and Systems, Tsinghua National Laboratory for Information Science and Technology, Department of Automation, Tsinghua University, Beijing 100084, Chin ...

  • Venue:
  • Pattern Recognition
  • Year:
  • 2009

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Abstract

Trace ratio is a natural criterion in discriminant analysis as it directly connects to the Euclidean distances between training data points. This criterion is re-analyzed in this paper and a fast algorithm is developed to find the global optimum for the orthogonal constrained trace ratio problem. Based on this problem, we propose a novel semi-supervised orthogonal discriminant analysis via label propagation. Differing from the existing semi-supervised dimensionality reduction algorithms, our algorithm propagates the label information from the labeled data to the unlabeled data through a specially designed label propagation, and thus the distribution of the unlabeled data can be explored more effectively to learn a better subspace. Extensive experiments on toy examples and real-world applications verify the effectiveness of our algorithm, and demonstrate much improvement over the state-of-the-art algorithms.