Defect rate profile in large software-systems

Authors:
Elena-Ramona Modroiu;Ina Schieferdecker
Affiliations:
FOKUS Fraunhofer Institute, Berlin, Germany;FOKUS Fraunhofer Institute, Berlin, Germany
Venue:
Proceedings of the 2006 conference on Knowledge-Based Software Engineering: Proceedings of the Seventh Joint Conference on Knowledge-Based Software Engineering
Year:
2006

Citing 2
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Abstract

Software reliability, an issue raised long time ago by software engineering researchers, is still a problem that must be faced nowadays. Our approach is to handle reliability of software products making use of a statistical distribution based model and historical data of similar projects. We analyze the software error metrics of large software projects developed in a multinational company in the last five years, searching for a Rayleigh pattern in the defect rate profile. If we can prove empirically such a pattern exists in certain environment, we have a rapid and powerful theoretical model to support project estimation decisions early in the development life cycle when historical data on similar projects is available.