Extraction of Illumination-Invariant Features in Face Recognition by Empirical Mode Decomposition

  • Authors:
  • Dan Zhang;Yuan Yan Tang

  • Affiliations:
  • Department of Computer Science, Hong Kong Baptist University, Hong Kong SAR, China;Department of Computer Science, Hong Kong Baptist University, Hong Kong SAR, China

  • Venue:
  • ICB '09 Proceedings of the Third International Conference on Advances in Biometrics
  • Year:
  • 2009

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Abstract

Two Empirical Mode Decomposition (EMD) based face recognition schemes are proposed in this paper to address variant illumination problem. EMD is a data-driven analysis method for nonlinear and non-stationary signals. It decomposes signals into a set of Intrinsic Mode Functions (IMFs) that containing multiscale features. The features are representative and especially efficient in capturing high-frequency information. The advantages of EMD accord well with the requirements of face recognition under variant illuminations. Earlier studies show that only the low-frequency component is sensitive to illumination changes, it indicates that the corresponding high-frequency components are more robust to the illumination changes. Therefore, two face recognition schemes based on the IMFs are generated. One is using the high-frequency IMFs directly for classification. The other one is based on the synthesized face images fused by high-frequency IMFs. The experimental results on the PIE database verify the efficiency of the proposed methods.