A highly configurable test system for evolutionary black-box testing of embedded systems

  • Authors:
  • Peter M. Kruse;Joachim Wegener;Stefan Wappler

  • Affiliations:
  • Berner & Mattner Systemtechnik GmbH, Berlin, Germany;Berner & Mattner Systemtechnik GmbH, Berlin, Germany;Berner & Mattner Systemtechnik GmbH, Berlin, Germany

  • Venue:
  • Proceedings of the 11th Annual conference on Genetic and evolutionary computation
  • Year:
  • 2009

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Abstract

During the development of electronic control units (ECU) in domains like the automotive industry, tests are performed on various test platforms, such as model-in-the-loop, software-in-the-loop, processor-in-the-loop, and hardware-in-the-loop platforms in order to find faults in early development stages. Test cases must be specified to verify the properties demanded of the system on these test platforms. This is an expensive and non-trivial task. Evolutionary black-box testing, a recent approach to automating the creation of interesting test cases, can solve this task completely automatically. This paper describes our evolutionary test system and how to apply it to the test of functional and non-functional properties of embedded systems. Our system supports the aforementioned test platforms and allows for the reuse of the generated test cases across them. In a case study with an antilock braking system, we demonstrate the operation of the system.