MC/DC automatic test input data generation

  • Authors:
  • Zeina Awedikian;Kamel Ayari;Giuliano Antoniol

  • Affiliations:
  • Ecole Polytechnique de Montreal, Montreal, PQ, Canada;Ecole Polytechnique de Montreal, Montreal, PQ, Canada;Ecole Polytechnique de Montreal, Montreal, PQ, Canada

  • Venue:
  • Proceedings of the 11th Annual conference on Genetic and evolutionary computation
  • Year:
  • 2009

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Abstract

In regulated domain such as aerospace and in safety critical domains, software quality assurance is subject to strict regulation such as the RTCA DO-178B standard. Among other conditions, the DO-178B mandates for the satisfaction of the modified condition/decision coverage (MC/DC) testing criterion for software where failure condition may have catastrophic consequences. MC/DC is a white box testing criterion aiming at proving that all conditions involved in a predicate can influence the predicate value in the desired way. In this paper, we propose a novel fitness function inspired by chaining test data generation to efficiently generate test input data satisfying the MC/DC criterion. Preliminary results show the superiority of the novel fitness function that is able to avoid plateau leading to a behavior close to random test of traditional white box fitness functions.