Compressive confocal microscopy

  • Authors:

  • P. Ye;J. L. Paredes;G. R. Arce;Y. Wu;C. Chen;D. W. Prather

  • Affiliations:

  • Department of Electrical and Computer Engineering, University of Delaware, Newark, 19716, USA;Department of Electrical and Computer Engineering, University of Delaware, Newark, 19716, USA;Department of Electrical and Computer Engineering, University of Delaware, Newark, 19716, USA;Department of Electrical and Computer Engineering, University of Delaware, Newark, 19716, USA;Department of Electrical and Computer Engineering, University of Delaware, Newark, 19716, USA;Department of Electrical and Computer Engineering, University of Delaware, Newark, 19716, USA

  • Venue:
  • ICASSP '09 Proceedings of the 2009 IEEE International Conference on Acoustics, Speech and Signal Processing
  • Year:
  • 2009

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Abstract

In this paper, a new framework for confocal microscopy based on the novel theory of compressive sensing is proposed. Unlike wide field microscopy or conventional parallel beam confocal imaging systems that use charge-coupled devices (CCD) as acquisition devices in addition to complex mechanical scanning system, the proposed compressive confocal microscopy is a kind of parallel beam confocal imaging system which exploits the rich theory of compressive sensing by using a single pixel detector and a digital micromirror device (DMD) to capture linear projections of the in-focus image. With the proposed system, confocal imaging of high optical sectioning ability can be achieved at sub-Nyquist sampling rates. Theoretical analysis, simulations and experimental results are shown to demonstrate the characteristics and potential of the proposed approach.