Detection of machine failure: Hidden Markov Model approach

Authors:
Allen H. Tai;Wai-Ki Ching;L. Y. Chan
Affiliations:
Department of Industrial and Manufacturing Systems Engineering, The University of Hong Kong, Pokfulam Road, Hong Kong;Advanced Modeling and Applied Computing Laboratory and Department of Mathematics, The University of Hong Kong, Pokfulam Road, Hong Kong;Department of Industrial and Manufacturing Systems Engineering, The University of Hong Kong, Pokfulam Road, Hong Kong
Venue:
Computers and Industrial Engineering
Year:
2009

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Abstract

Hidden Markov Models (HMMs) are widely used in applied sciences and engineering. The potential applications in manufacturing industries have not yet been fully explored. In this paper, we propose to apply HMM to detect machine failure in process control. We propose models for both cases of indistinguishable production units and distinguishable production units. Numerical examples are given to illustrate the effectiveness of the proposed models.