Multi-view and Multi-scale Recognition of Symmetric Patterns

Authors:
Dereje Teferi;Josef Bigun
Affiliations:
Halmstad University, Halmstad, Sweden SE 30118;Halmstad University, Halmstad, Sweden SE 30118
Venue:
SCIA '09 Proceedings of the 16th Scandinavian Conference on Image Analysis
Year:
2009

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Abstract

This paper suggests the use of symmetric patterns and their corresponding symmetry filters for pattern recognition in computer vision tasks involving multiple views and scales. Symmetry filters enable efficient computation of certain structure features as represented by the generalized structure tensor (GST). The properties of the complex moments to changes in scale and multiple views including in-depth rotation of the patterns and the presence of noise is investigated. Images of symmetric patterns captured using a low resolution low-cost CMOS camera, such as a phone camera or a web-cam, from as far as three meters are precisely localized and their spatial orientation is determined from the argument of the second order complex moment I 20 without further computation.