Statistical High-Level Synthesis under Process Variability

  • Authors:
  • Yuan Xie;Yibo Chen

  • Affiliations:
  • Pennsylvania State University;Pennsylvania State University

  • Venue:
  • IEEE Design & Test
  • Year:
  • 2009

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Abstract

Editor's note:CMOS process variability is a major challenge in deep-submicron SoC designs. The variations in transistor parameters are complicating both timing and power consumption prediction. This article surveys recent progress in the statistical high-level synthesis area.—Philippe Coussy, Université de Bretagne-Sud