Detection of elliptic and linear edges by searching two parameter spaces

Authors:
Saburo Tsuji;Fumio Matsumoto
Affiliations:
Department of Control Engineering, Osaka University, Toyonaka, Osaka, Japan;Department of Control Engineering, Osaka University, Toyonaka, Osaka, Japan
Venue:
IJCAI'77 Proceedings of the 5th international joint conference on Artificial intelligence - Volume 2
Year:
1977

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Abstract

The Hough transformation can detect straight lines in an edge-enhanced picture; however, its extension t o recover ellipses requires too much computing time. This paper proposes a modified method which utilizes two properties of an ellipse in such a way that it iteratively searches for clusters in two different parameter spaces to find visible ellipses, then evaluates their parameters by the least means squares method.