The learning of parameters for generating compound characterizers for pattern recognition

Authors:
Leonard Uhr;Sara Jordan
Affiliations:
University of Wisconsin, Madison, Wisconsin;University of Wisconsin, Madison, Wisconsin
Venue:
IJCAI'69 Proceedings of the 1st international joint conference on Artificial intelligence
Year:
1969

Citing 3
Cited 2

Discovery and learning techniques for pattern recognition

ACM '64 Proceedings of the 1964 19th ACM national conference
Pattern recognition and reading by machine

IRE-AIEE-ACM '59 (Eastern) Papers presented at the December 1-3, 1959, eastern joint IRE-AIEE-ACM computer conference
A pattern recognition program that generates, evaluates, and adjusts its own operators

IRE-AIEE-ACM '61 (Western) Papers presented at the May 9-11, 1961, western joint IRE-AIEE-ACM computer conference

Progress in Picture Processing: 1969--71

ACM Computing Surveys (CSUR)
Layered "Recognition Cone" Networks That Preprocess, Classify, and Describe

IEEE Transactions on Computers

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Abstract

This paper discusses and feasibility and desirability of constructing a "programming laboratory " which would cooperate with the user in the development of his programs, freeing him to concentrate more fully on the conceptual diffculties of the problem ...