First-order incremental block-based statistical timing analysis
Proceedings of the 41st annual Design Automation Conference
Statistical Timing Analysis Considering Spatial Correlations using a Single Pert-Like Traversal
Proceedings of the 2003 IEEE/ACM international conference on Computer-aided design
Proceedings of the 42nd annual Design Automation Conference
Correlation-preserved non-gaussian statistical timing analysis with quadratic timing model
Proceedings of the 42nd annual Design Automation Conference
ICCAD '05 Proceedings of the 2005 IEEE/ACM International conference on Computer-aided design
ICCAD '05 Proceedings of the 2005 IEEE/ACM International conference on Computer-aided design
Criticality computation in parameterized statistical timing
Proceedings of the 43rd annual Design Automation Conference
Variation-aware performance verification using at-speed structural test and statistical timing
Proceedings of the 2007 IEEE/ACM international conference on Computer-aided design
Incremental criticality and yield gradients
Proceedings of the conference on Design, automation and test in Europe
Statistical path selection for at-speed test
Proceedings of the 2008 IEEE/ACM International Conference on Computer-Aided Design
Fast statistical timing analysis for circuits with post-silicon tunable clock buffers
Proceedings of the International Conference on Computer-Aided Design
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Correct ordering of timing quantities is essential for both timing analysis and design optimization in the presence of process variation, because timing quantities are no longer a deterministic value, but a distribution. This paper proposes a novel metric, called tiered criticalities, which guarantees to provide a unique order for a set of correlated timing quantities while properly taking into account full process space coverage. Efficient algorithms are developed to compute this metric, and its effectiveness on path ranking for at-speed testing is also demonstrated.