Comment on ``A Nonlinear Mapping for Data Structure Analysis''

Authors:
I. White
Affiliations:
Electronics Research Laboratory, Plessey Company, Havant, England.
Venue:
IEEE Transactions on Computers
Year:
1972

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Non-linear dimensionality reduction techniques for unsupervised feature extraction

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The equal-angle spanning tree mapping: A sequential method for projecting from h-space to 2-space

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Abstract

An alternative metric for use with Sammon's nonlinear mapping is suggested. Rather than Euclidean, the Hamming metric is proposed as a means of reducing the iteration time.