Large-SNR error probability analysis of BICM with uniform interleaving in fading channels

  • Authors:
  • Alfonso Martinez;Albert Guillén i Fàbregas

  • Affiliations:
  • Centrum Wiskunde & Informatica, Amsterdam, The Netherlands;Department of Engineering, University of Cambridge, Cambridge, UK

  • Venue:
  • IEEE Transactions on Wireless Communications
  • Year:
  • 2009

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Abstract

This paper studies the average error probability of bit-interleaved coded modulation with uniform interleaving in fully-interleaved fading channels. At large signal-to-noise ratio, the dominant pairwise error events are mapped into symbols with Hamming weight larger than one, causing a flattening of the error probability. Closed-form expressions for the error probability with general modulations are provided. For interleavers of practical length, the flattening is noticeable only at very low values of the error probability.