Texture segmentation using Gabor modulation/demodulation
Pattern Recognition Letters
Texture Measures for Carpet Wear Assessment
IEEE Transactions on Pattern Analysis and Machine Intelligence
A Theory for Multiresolution Signal Decomposition: The Wavelet Representation
IEEE Transactions on Pattern Analysis and Machine Intelligence
Scale-Space and Edge Detection Using Anisotropic Diffusion
IEEE Transactions on Pattern Analysis and Machine Intelligence
Texture analysis and discrimination in additive noise
Computer Vision, Graphics, and Image Processing
Maximum likelihood unsupervised textured image segmentation
CVGIP: Graphical Models and Image Processing
Texture Classification Using Windowed Fourier Filters
IEEE Transactions on Pattern Analysis and Machine Intelligence
Nonlinear multiscale representations for image segmentation
Computer Vision and Image Understanding
Fast color texture recognition using chromaticity moments
Pattern Recognition Letters
An automatic assessment scheme for steel quality inspection
Machine Vision and Applications
Robust Defect Segmentation in Woven Fabrics
CVPR '98 Proceedings of the IEEE Computer Society Conference on Computer Vision and Pattern Recognition
Wavelet methods for texture defect detection
ICIP '97 Proceedings of the 1997 International Conference on Image Processing (ICIP '97) 3-Volume Set-Volume 3 - Volume 3
A constrained minimisation approach to optimise Gabor filters for detecting flaws in woven textiles
ICASSP '00 Proceedings of the Acoustics, Speech, and Signal Processing, 2000. on IEEE International Conference - Volume 06
An anisotropic diffusion-based defect detection for low-contrast glass substrates
Image and Vision Computing
Identifying and Locating Surface Defects in Wood: Part of an Automated Lumber Processing System
IEEE Transactions on Pattern Analysis and Machine Intelligence
Texture analysis and classification with tree-structured wavelet transform
IEEE Transactions on Image Processing
Removal of surface artifacts of material volume data with defects
ICCSA'11 Proceedings of the 2011 international conference on Computational science and its applications - Volume Part II
Wavelet-based defect detection in solar wafer images with inhomogeneous texture
Pattern Recognition
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This paper proposes a machine vision scheme for detecting micro-crack defects in solar wafer manufacturing. The surface of a polycrystalline silicon wafer shows heterogeneous textures, and the shape of a micro-crack is similar to the multi-grain background. They make the automated visual inspection task extremely difficult. The low gray-level and high gradient are two main characteristics of a micro-crack in the sensed image with front-light illumination. An anisotropic diffusion scheme is proposed to detect the subtle defects. The proposed diffusion model takes both gray-level and gradient as features to adjust the diffusion coefficients. It acts as an adaptive smoothing process. Only the pixels with both low gray-levels and high gradients will generate high diffusion coefficients. It then smoothes the suspected defect region and preserves the original gray-levels of the faultless background. By subtracting the diffused image from the original image, the micro-crack can be distinctly enhanced in the difference image. A simple binary thresholding, followed by morphological operations, can then easily segment the micro-crack. The proposed method has shown its effectiveness and efficiency for a test set of more than 100 wafer images. It has also achieved a fast computation of 0.09s for a 640x480 image.