A process-integrated approach to defect prevention

  • Authors:
  • C. L. Jones

  • Affiliations:
  • IBM Communication Products Division, Research Triangle Park, North Carolina

  • Venue:
  • IBM Systems Journal
  • Year:
  • 1985

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Abstract

Recent efforts to improve quality in software have concentrated on defect detection. This paper presents a programming process methodology for using causal analysis and feedback as a means for achieving quality improvements and ultimately defect prevention. The methodology emphasizes effective utilization of all error data to prevent the recurrence of defects.