Empirically derived micromodels for sequences of page exceptions

Authors:
P. A. W. Lewis;G. S. Shedler
Affiliations:
Naval Postgraduate School, Monterey, California;IBM Research Division Laboratory, San Jose, California
Venue:
IBM Journal of Research and Development
Year:
1973

Citing 3
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Abstract

Based on a statistical analysis of actual computer program address traces, some results are presented of a study aimed at deriving empirically valid stochastic models for program reference patterns in a computer system operating under demand paging. For the address traces examined, a semi-Markov model for the (univariate) point process of page exceptions is formulated and found to be an adequate characterization of the data.