Thermal modeling of the infrared reflow process for solder ball connect (SBC)

  • Authors:
  • H. V. Mahaney

  • Affiliations:
  • IBM Advanced Workstations and Systems Division, Austin, Texas

  • Venue:
  • IBM Journal of Research and Development
  • Year:
  • 1993

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Abstract

A thermal model of the infrared reflow process has been developed for an FR-4 card populated with an array of Solder Ball Connect (SBC) modules. The analysis of the three-dimensional, transient, finite element model accounts for radiative exchange within the infrared oven and for the heat conduction (nonisotropic) within the modules and card. Transient temperature profiles of selected points and three-dimensional temperature distributions at selected times are presented to describe the primary heat-transport mechanisms. Numerical predictions and empirical data indicate that the SBC modules are relatively isothermal throughout the infrared reflow process. Therefore, every solder ball within the array exhibits a nearly identical thermal profile. This result is fortunate, since the inner solder ball connections cannot be visually inspected. The influence of module spacing and the ability to improve the reflow process by use of a high-emissivity cap coating are demonstrated.