Special issue on noisy text analytics

  • Authors:

  • Daniel Lopresti;Shourya Roy;Klaus Schulz;L. Venkata Subramaniam

  • Affiliations:

  • Lehigh University, Bethlehem, PA, USA;Xerox Corporation, Xerox India Innovation Hub, Chennai, India;University of Munich, Munich, Germany;IBM India Research Lab, New Delhi, India

  • Venue:
  • International Journal on Document Analysis and Recognition - Special Issue NOISY
  • Year:
  • 2009

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Abstract