Film line scratch detection using texture and shape information

  • Authors:
  • Kyung-tai Kim;Eun Yi Kim

  • Affiliations:
  • Department of Advanced Technology Fusion, Konkuk University, 1 Hwayang-dong, Gwangjin-gu, Seoul 143-701, South Korea;Department of Advanced Technology Fusion, Konkuk University, 1 Hwayang-dong, Gwangjin-gu, Seoul 143-701, South Korea

  • Venue:
  • Pattern Recognition Letters
  • Year:
  • 2010

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Abstract

A scratch detection and restoration is very important, as scratches are the most common form of degradation of old films. The goal of the current study is to develop a fully automated system that can detect all types of scratch with a low computational cost. This is achieved by defining the texture and shape properties from spatial domain, then using these for scratch detection. The proposed method involves two procedures: (1) the input image is divided into scratches and non-scratches using a neural network (NN)-based texture classifier and (2) some false alarms are removed by shape filtering using a morphological filter with new structuring elements defined based on the shape characteristics of scratches. To assess the validity of the proposed method, experiments were performed with several films, and the results showed that its performance was superior to that of other method.