Fault localization using passive end-to-end measurement and sequential testing for wireless sensor networks

Authors:
Bing Wang;Wei Wei;Wei Zeng;Krishna R. Pattipati
Affiliations:
Computer Science & Engineering Dept., University of Connecticut, Storrs, CT;Computer Science & Engineering Dept., University of Connecticut, Storrs, CT;Computer Science & Engineering Dept., University of Connecticut, Storrs, CT;Electrical & Computer Engineering Dept., University of Connecticut, Storrs, CT
Venue:
SECON'09 Proceedings of the 6th Annual IEEE communications society conference on Sensor, Mesh and Ad Hoc Communications and Networks
Year:
2009

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Abstract

Faulty components in a network need to be localized and repaired to sustain the health of the network. In this paper, we propose a novel approach that carefully combines active and passive measurements to localize faults in wireless sensor networks. More specifically, we formulate a problem of optimal sequential testing guided by end-to-end data. This problem determines an optimal testing sequence of network components based on end-to-end data in sensor networks to minimize testing cost. We prove that this problem is NP-hard and propose a greedy algorithm to solve it. Extensive simulation shows that in most settings our algorithm only requires testing a very small set of network components to localize and repair all faults in the network. Our approach is superior to using active and passive measurements in isolation. It also outperforms the state-of-the-art approaches that localize and repair all faults in a network.