Model-Based Testing of Electronic Passports

Authors:
Wojciech Mostowski;Erik Poll;Julien Schmaltz;Jan Tretmans;Ronny Wichers Schreur
Affiliations:
Radboud University, Nijmegen, The Netherlands;Radboud University, Nijmegen, The Netherlands;Embedded Systems Institute (ESI), Eindhoven, The Netherlands;Radboud University, Nijmegen, The Netherlands and Embedded Systems Institute (ESI), Eindhoven, The Netherlands;Radboud University, Nijmegen, The Netherlands
Venue:
FMICS '09 Proceedings of the 14th International Workshop on Formal Methods for Industrial Critical Systems
Year:
2009

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Abstract

Electronic passports, or e-passports for short, contain a contactless smartcard which stores digitally-signed data. To rigorously test e-passports, we developed formal models of the e-passport protocols that enable model-based testing using the TorXakis framework.