CT-EXT: an algorithm for computing typical testor set
CIARP'07 Proceedings of the Congress on pattern recognition 12th Iberoamerican conference on Progress in pattern recognition, image analysis and applications
Using typical testors for feature selection in text categorization
CIARP'07 Proceedings of the Congress on pattern recognition 12th Iberoamerican conference on Progress in pattern recognition, image analysis and applications
A fast implementation of the CT_EXT algorithm for the testor property identification
MICAI'10 Proceedings of the 9th Mexican international conference on Artificial intelligence conference on Advances in soft computing: Part II
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Typical testors are very useful in Pattern Recognition, especially for Feature Selection problems. The complexity of computing all typical testors of a training matrix has an exponential growth with respect to the number of features. Several methods that speed up the calculation of the set of all typical testors have been developed, but nowadays, there are still problems where this set is impossible to find. With this aim, a new external scale algorithm BR is proposed. The experimental results demonstrate that this method clearly outperforms the two best algorithms reported in the literature.