Metric in Feature Space

Authors:
C. A. Murthy;Sourav Pradhan
Affiliations:
Machine Intelligence Unit, Indian Statistical Institute, Kolkata, India 700108;Machine Intelligence Unit, Indian Statistical Institute, Kolkata, India 700108
Venue:
PReMI '09 Proceedings of the 3rd International Conference on Pattern Recognition and Machine Intelligence
Year:
2009

Citing 5
Cited 1

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Abstract

In this paper our purpose is to define a metric in feature space. The metric finds the correlation distance between two features. It may be used in many applications. An application showing the utility of the proposed metric for feature selection is described here. The performance of the feature selection method is found to be comparable to other feature selection methods.