MRF Based LSB Steganalysis: A New Measure of Steganography Capacity

Authors:
Debasis Mazumdar;Apurba Das;Sankar K. Pal
Affiliations:
CDAC, Kolkata, Salt Lake Electronics Complex, Kolkata, India;CDAC, Kolkata, Salt Lake Electronics Complex, Kolkata, India;Indian Statistical Institute, Kolkata, India
Venue:
PReMI '09 Proceedings of the 3rd International Conference on Pattern Recognition and Machine Intelligence
Year:
2009

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Abstract

A new steganalysis algorithm is described based on the MRF model of image LSB plane. In this framework the limitation of the Cachin's definition of the steganography capacity is quantified and a new measure is proposed.