Detection of clustered microcalcifications using spatial point process modeling

  • Authors:

  • Hao Jing;Yongyi Yang

  • Affiliations:

  • Department of Electrical and Computer Engineering, Illinois Institute of Technology, Chicago, IL;Department of Electrical and Computer Engineering, Illinois Institute of Technology, Chicago, IL

  • Venue:
  • ISBI'09 Proceedings of the Sixth IEEE international conference on Symposium on Biomedical Imaging: From Nano to Macro
  • Year:
  • 2009

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Abstract

We propose a spatial point process approach to improve the detection accuracy of clustered microcalcifications (MCs) in mammogram images. The conventional approach to MC detection has been to first detect the individual MCs in an image independently, which are subsequently grouped into clusters. Our proposed approach aims to exploit the spatial distribution among the different MCs directly during the detection process. We model the MCs by a marked point process (MPP) in which spatially neighboring MCs interact with each other. The MCs are then simultaneously detected through maximum a posteriori (MAP) estimation of the model parameters of the MPP process. The proposed approach was evaluated with a dataset of 141 clinical mammograms from 66 cases, and the results show that it could yield improved detection performance compared to a recently proposed SVM detector.