Improved registration for large electron microscopy images

Authors:
Ayelet Akselrod-Ballin;Davi Bock;R. Clay Reid;Simon K. Warfield
Affiliations:
Computational Radiology Laboratory, Children's Hospital, Harvard Medical School, Boston;Department of Neurobiology, Harvard Medical School;Department of Neurobiology, Harvard Medical School;Computational Radiology Laboratory, Children's Hospital, Harvard Medical School, Boston
Venue:
ISBI'09 Proceedings of the Sixth IEEE international conference on Symposium on Biomedical Imaging: From Nano to Macro
Year:
2009

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Abstract

In this paper we introduce a novel algorithm for alignment of Electron Microscopy images for 3D reconstruction. The algorithm extends the Expectation Maximization - Iterative Closest Points (EM-ICP) algorithm to go from point matching to patch matching. We utilize local patch characteristics to achieve improved registration. The method is applied to enable 3D reconstruction of Transmission Electron Microscopy (TEM) images. We demonstrate results on large TEM images and show the increased alignment accuracy of our approach.