The maximum likelihood probability of skewed patterns

Authors:
Alan Orlitsky;Shengjun Pan
Affiliations:
ECE & CSE Departments, UCSD;CSE Department, UCSD
Venue:
ISIT'09 Proceedings of the 2009 IEEE international conference on Symposium on Information Theory - Volume 2
Year:
2009

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ISIT'09 Proceedings of the 2009 IEEE international conference on Symposium on Information Theory - Volume 2

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Abstract

A pattern is skewed if, as in 11123, one of its symbols repeats and the others appear once. We show that the pattern-maximum-likelihood distribution of essentially all skewed patterns consists of one discrete element whose probability is the fraction of times the repeated symbol appears in the pattern.