DPVK - An Eclipse Plug-in to Detect Design Patterns in Eiffel Systems

Authors:
Wei Wang;Vassilios Tzerpos
Affiliations:
Department of Computer Science, York University, Toronto, Canada;Department of Computer Science, York University, Toronto, Canada
Venue:
Electronic Notes in Theoretical Computer Science (ENTCS)
Year:
2004

Citing 13
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Abstract

Design patterns are not only beneficial to the forward engineering process but also help in design recovery and program understanding, typical reverse engineering activities. In this paper, we introduce DPVK, a reverse engineering tool to detect pattern instances in Eiffel systems. In order to get better detection results, we analyze many different patterns and examine Eiffel software in terms of both static structure and dynamic behaviour. DPVK is implemented as an Eclipse plug-in to ensure better compatibility and extensibility.