Wireless network resilience to degree-dependent and cascading node failures

Authors:
Zhenning Kong;Edmund M. Yeh
Affiliations:
Department of Electrical Engineering, Yale University, New Haven, CT;Department of Electrical Engineering, Yale University, New Haven, CT
Venue:
WiOPT'09 Proceedings of the 7th international conference on Modeling and Optimization in Mobile, Ad Hoc, and Wireless Networks
Year:
2009

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Abstract

Multiuser information-theoretic analysis of achievable communication rate regions over networks traditionally assumes that individual sources of information are independent. However, fully exploiting network-wide synergies requires an understanding of ...