New closed-form bounds on the performance of coding in correlated Rayleigh fading

Authors:
Dwight K. Hutchenson;Daniel L. Noneaker
Affiliations:
MIT Lincoln Laboratory, Lexington, MA and Holcombe Department of Electrical and Computer Engineering, Clemson University, Clemson, SC;Holcombe Department of Electrical and Computer Engineering, Clemson University, Clemson, SC
Venue:
IEEE Transactions on Communications
Year:
2009

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Abstract

New, simple bounds are presented for the probability of error in a binary hypothesis test for communications using diversity signaling in correlated Rayleigh fading. The bounds are developed in the context of pairwise error-event probabilities in decoding an error-correction code. A long-standing conjecture regarding the form of worst-case error events in exponentially correlated Rayleigh fading is also proven. The utility of the results is illustrated by their application to transfer-function bounds on the probability of bit error for a system using a convolutional code. The closed-form transfer-function bounds are shown to be tighter than previously developed transfer-function bounds for communications in exponentially correlated Rayleigh fading.