Test-pattern-reduced decoding for turbo product codes with multi-error-correcting eBCH codes

  • Authors:

  • Guo Tai Chen;Lei Cao;Lun Yu;Chang Wen Chen

  • Affiliations:

  • College of Physics & Information Engineering, Fuzhou University, Fuzhou, Fujian Province, PROC and Fujian Normal Univerisity, Fuqing, Fujian Province, PROC;Department of EE, University of Mississippi, University, MS;College of Physics & Information Engineering, Fuzhou University, Fuzhou, Fujian Province, PROC;Department of CSE, University of Buffalo, NY

  • Venue:
  • IEEE Transactions on Communications
  • Year:
  • 2009

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Abstract

We present a method to reduce the number of test patterns (TPs) decoded in the Chase-II algorithm for turbo product codes (TPCs) constructed with multi-error-correcting extended Bose-Chaudhuri-Hocquengem (eBCH) codes. We classify TPs into different conditions based on the relationship between syndromes and the number of errors so that TPs with the same codeword are not decoded except the one with the least number of errors. For eBCH with code length of 64, simulation results show that over 50% of TPs need not to be decoded without any performance degradation.