On the relation between statistical properties of spectrographic masks and recognition accuracy

Authors:
J. F. Gemmeke;B. Cranen;L. ten Bosch
Affiliations:
Radboud University, Nijmegen, The Netherlands;Radboud University, Nijmegen, The Netherlands;Radboud University, Nijmegen, The Netherlands
Venue:
SPPRA '08 Proceedings of the Fifth IASTED International Conference on Signal Processing, Pattern Recognition and Applications
Year:
2008

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Abstract

Kernel machines are widely known as powerful tools in various fields of information science. One of central topics of kernel machines is a selection of a kernel function or its parameters. In terms of generalization ability, many methods, represented ...