Analysis of Effects of Texture Reflectance and Source Illumination on Focus Measures for Microscopic Images

  • Authors:

  • Aamir Saeed Malik;Tae-Sun Choi

  • Affiliations:

  • -;-

  • Venue:
  • ICCEE '09 Proceedings of the 2009 Second International Conference on Computer and Electrical Engineering - Volume 02
  • Year:
  • 2009

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Abstract

Focus measures are an integral part for the passive 3D shape recovery methods. This paper presents an analysis of various well established focus measures with varying texture reflectance and source illumination. Five focus measures are selected from the literature. Three different microscopic objects are selected for testing the texture reflectance. Three different levels are opted for source illumination. Among the passive methods, Shape From Focus (SFF) is selected to test the focus measures for accuracy and precision of depth estimation.