Estimating attributes: analysis and extensions of RELIEF
ECML-94 Proceedings of the European conference on machine learning on Machine Learning
Selection of relevant features and examples in machine learning
Artificial Intelligence - Special issue on relevance
Statistical Pattern Recognition: A Review
IEEE Transactions on Pattern Analysis and Machine Intelligence
Theoretical and Empirical Analysis of ReliefF and RReliefF
Machine Learning
Benchmarking Attribute Selection Techniques for Discrete Class Data Mining
IEEE Transactions on Knowledge and Data Engineering
Automatic recognition system for pejibaye palm DNA using SVM
ECC'08 Proceedings of the 2nd conference on European computing conference
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This paper presents a feature reduction method, applying to Deoxyribonucleic Acid (DNA) primer, obtaining 100% classes identification based on Support Vector Machines (SVM). In particular, the biochemical parameterization has 89 Random Amplified polymorphic DNA (RADP) primers of Pejibaye Palm races, and it has been reduced to 10 RADP primers. The interest of this application is economic and computational, because it is so much cheaper to calculate less primers (only 11.24% from the previous dataset); and therefore, this supervised classification system is faster in order to do a method of origin denomination plant certification.