Electrical impedance tomography using level set representation and total variational regularization

Authors:
Eric T. Chung;Tony F. Chan;Xue-Cheng Tai
Affiliations:
Department of Mathematics, University of California, Los Angeles, CA 90095-1555, USA;Department of Mathematics, University of California, Los Angeles, CA 90095-1555, USA;Department of Mathematics, University of Bergen, Johnnes Brunsgate 12, N-5007 Bergen, Norway
Venue:
Journal of Computational Physics
Year:
2005

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Abstract

In this paper, we propose a numerical scheme for the identification of piecewise constant conductivity coefficient for a problem arising from electrical impedance tomography. The key feature of the scheme is the use of level set method for the representation of interface between domains with different values of coefficients. Numerical tests show that our method can recover sharp interfaces and can tolerate a relatively high level of noise in the observation data. Results concerning the effects of number of measurements, noise level in the data as well as the regularization parameters on the accuracy of the scheme are also given.