RFID survivability quantification and attack modeling

Authors:
Yanjun Zuo
Affiliations:
University of North Dakota, Grand Forks, ND, USA
Venue:
Proceedings of the third ACM conference on Wireless network security
Year:
2010

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Abstract

In this paper, we present an RFID survivability experiment and quantitatively measure the degree of survivability of an RFID system under varying attacks. By modeling different malicious scenarios using stochastic process algebras, we show the different effects of those attacks on an RFID system's ability to provide critical services even when some components have been damaged. Our model relates its statistic to the attack strategies and security recovery. The model is the first of its kind to formally represent and simulate attacks on RFID systems from a survivability perspective and to measure the degree of survivability of an RFID system under different attacks.