ADC Non-Linearity Low-Cost Test Through a Simplified Double-Histogram Method

Authors:
M. A. Jalón;E. Peralías
Affiliations:
Instituto de Microelectrónica de Sevilla CNM-CSIC, Parque Tecnológico de La Cartuja, Seville, Spain 41092;Instituto de Microelectrónica de Sevilla CNM-CSIC, Parque Tecnológico de La Cartuja, Seville, Spain 41092
Venue:
Journal of Electronic Testing: Theory and Applications
Year:
2010

Citing 3
Cited 1

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An Improved Algorithm to Identify the Test Stimulus in Histogram-Based A/D Converter Testing

ETS '08 Proceedings of the 2008 13th European Test Symposium
Simple evaluation of the nonlinearity signature of an ADC using a spectral approach

VLSI Design

A novel implementation of the histogram-based technique for measurement of INL of LUT-based correction of ADC

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Abstract

This paper introduces a method to reduce the requirements of the test sources for evaluating the non-linearity characteristics of Analogue-to-Digital converters. The method is based on a non-interleaved Double-Histogram test independent of the test signal waveform. It has been validated by simulation results in a 16-bit pipeline A/D converter and by an experimental example using the AD6644 commercial converter.