The coupling effect: fact or fiction
TAV3 Proceedings of the ACM SIGSOFT '89 third symposium on Software testing, analysis, and verification
High Performance Software Testing on SIMD Machines
IEEE Transactions on Software Engineering
A Fortran language system for mutation-based software testing
Software—Practice & Experience
Comparison of program testing strategies
TAV4 Proceedings of the symposium on Testing, analysis, and verification
TAV4 Proceedings of the symposium on Testing, analysis, and verification
TAV4 Proceedings of the symposium on Testing, analysis, and verification
An integrated system for program testing using weak mutation and data flow analysis
ICSE '85 Proceedings of the 8th international conference on Software engineering
POPL '80 Proceedings of the 7th ACM SIGPLAN-SIGACT symposium on Principles of programming languages
On mutation
Efficient mutation analysis: a new approach
ISSTA '94 Proceedings of the 1994 ACM SIGSOFT international symposium on Software testing and analysis
The Efficiency of Critical Slicing in Fault Localization
Software Quality Control
| Hi-index | 0.00 |
Existing serial algorithms to do mutation analysis are inefficient, and descriptions of parallel mutation systems pre-suppose that these serial algorithms are the best one can do serially. We present a universal mutation analysis data structure and new serial algorithms for both strong and weak mutation analysis that on average should perform much faster than existing ones, and can never do worse. We describe these algorithms as well as the results of our analysis of their run time complexities. We believe that this is the first paper in which analytical methods have been applied to obtain the run time complexities of mutation analysis algorithms.